Description
High-Frequency Current Transformer
The Magnelab High-Frequency Current Transformer (HFCT) series provides a very accurate, non-contact, non-destructive measurement of a single or repetitive bipolar or unipolar pulse. Additionally, it can accurately measure AC current at a higher range of frequencies than standard current transformer designs. As indicated by the name, the HFCT is designed for a higher frequency range of up to 500 MHz; however, it can also reach down to 0.5 Hz depending on the ratio and size selected. The HFCT series is designed to measure current pulses of 200 to 20,000 amps DC or AC current of 2 to 71 amps, depending on the ratio and size selected. These units come with window sizes from 1/4 to 2 inches. In addition, they are available with voltage output ranges from 0.025 to 5.0 V/A. The transformer’s output voltage is typically connected directly to an oscilloscope, high-frequency power meter, or spectrum analyzer by coaxial cable as the impedance is matched for 50 Ohms. HFCT series are available with BNC connectors or SMA connectors. In addition, all units ship with hardcopy of the final test with detailed printed results.
Click here for the Operational and Installation Guide.
Features
- Higher frequency cutoff, assuring faithful rendering of fast transients
- Up to five times more sensitive for low-intensity signal measurement
- Measures current from just microamperes up to 20,000 amperes
- Operation temperature -20 degrees C to plus 120 degrees C
- Higher nominal accuracy ±0.5% over a wider bandwidth
- Low phase shift over a wide bandwidth
- 50 Ohm output impedance for use with high-frequency equipment.
- Choice of Connectors available. BNC is for all sizes, and SMA is for only C through F.
Applications
- Laser and plasma research
- EMC and EMI research
- Semiconductor gate switching
- Power system harmonics and transients
- Lightning research and simulation testing
- Capacitor and electrostatic discharges
- Corona wire discharge
- Partial Discharge measurement
- Critical monitoring of current fluctuations
- High-frequency lighting ballast measurements
- Plasma Processing for Microelectronics
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